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DIGITAL LINK MEASURING INSTRUMENTS
2
Conforms to ITU-T O.172
Frequency: 2488.32 MHz
Modulation frequency: 0.1 Hz to 20 MHz
Amplitude: 0 to 808.0 UIp-p
Resolution: 0.001 UIp-p (2 UI range), 0.01 UIp-p (20 UI range), 0.4 UIp-p (800 UI range)
Jitter generation
Accuracy
2 UI range: (±Q% of setting) ±0.02 UIp-p, 20 UI range: (±Q% of setting) ±0.3 UIp-p, 800 UI range: (±Q% of setting) ±12.5 UIp-p
Frequency offset
Range: ±100 ppm/0.1 ppm steps (jitter on/off)
Accuracy: ±0.1 ppm (after power-on, calibrate after 60 min warm-up, 23˚±5 ˚C)
Auxiliary interface External clock input, Jitter reference output
Conforms to ITU-T O.172
Frequency: 2488.32 MHz ±100 ppm
Modulation frequency: 10 Hz to 20 MHz
Amplitude: 0.0 to 32 UI
Resolution: 0.001 UIp-p/0.001 UIrms (2 UI range), 0.01 UIp-p/0.01 UIrms (32 UI range)
Jitter measurement
•
MU150011A 2.5G Jitter Unit
Bit rate F1 F1' F2
∗
F2'
∗
F3
∗
F4
∗
F5
∗
(Mbit/s) (Hz) (Hz) (kHz) (kHz) (MHz) (MHz) (MHz)
2488.32 0.1 60 2.5 30 1.2 2 20
∗Typical value
Bit rate
(Mbit/s)
Error Q Frequency range
±12% 0.1 Hz to 5 kHz
±8% 5 to 500 kHz
2488.32
±12% 0.5 to 2 MHz
±15% 2 to 20 MHz
Off: Able to set non-modulated status
TDEV mask:
Reference wander The 37 types of TDEV masks that are regulated by ITU-T, ETSI, ANSI, and Bellcore standards are available as default.
generation (Option 03) It is possible to add the wander modulation on the user specified TDEV mask.
Transient: It is possible to change the A (1 – e
–63.7t
) phase by the timing of the start.
Signal off: It is possible to disconnect the standard signal.
Conform to ITU-T O.172
Reference input: 2.048M (HDB3, Clock), 1.544M (AMI/B8ZS, Clock), 64k + 8 kHz, 5 MHz, 10 MHz
Sampling frequency: 40 Hz, 1 Hz, 0.1 Hz, 5 mHz (select by MX150001B)
Measurement range
P-P: 0.0 to 2E10 ns, +P/–P: 0.0 to 1E10 ns, TIE: 0.0 to ±1E10 ns
Accuracy: Conform to ITU-T O.172
Wander measurement Measurement time: 10 to 1 x 10
8
s (max. 120, 000 s; MP1570A only)
(Option 02) Wander application (requires MX150001B Wander Application Software)
TIE: Max. 1 x 10
8
s, MTIE: Max. 1 x 10
8
s, TDEV: Max. 1 x 10
6
s
Frequency offset: Measurement conforms to ANSI TI.105.09
Frequency drift rate: Measurement conforms to ANSI TI.105.09
MRTIE: The evaluation separated from the wander by a frequency offset
Wander tolerance (TDEV) measurement: Evaluation by the various TDEV mask generations
Wander transfer (TDEV) measurement: Calibration method by simulation,outputting results by the one measurement
Bit rate F0 F0' F2' F2'' F3' F4
(Mbit/s) (Hz) (Hz) (kHz) (kHz) (MHz) (MHz)
2488.32
2 UI – 100 – 100 1 20
32 UI 10 – 6.25 – 120
Continued on next page
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