Anritsu MP1777A Bedienungsanleitung Seite 29

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Modulation frequency: 10 µHz to 0.2 Hz (sine wave)
Amplitude: 0 to 57,600 UIp-p (30 UIp-p steps)
Line wander generation
Accuracy: ±Q% ±160 UIp-p
Auto wander measurement
Wander sweep measurement
Reference wander generation is valid when MU150005A/150006A/150007A Option 03 is mounted.
Off: Able to set non-modulated status
Reference wander
TDEV mask:
generation
The 37 types of TDEV masks that are regulated by ITU-T, ETSI, ANSI, and Bellcore standards are available as default.
It is possible to add the wander modulation to the user specified TDEV mask.
Transient: It is possible to change the A (1 – e
–63.7t
) phase by the timing of the start.
Signal off: It is possible to disconnect the standard signal.
Wander measurement is valid when MU150005A/150006A/150007A Option 02 is mounted. Conforms to ITU-T O.172
Reference input: 2.048M (HDB3, clock), 1.544M (AMI/B8ZS, clock), 64k + 8 kHz, 5 MHz, 10 MHz
Sampling frequency: 320 Hz, 40 Hz, 1 Hz, 0.1 Hz, 5 mHz (select from MX150001B)
Measurement range
P-P: 0.0 to 2E10 ns, +P/–P: 0.0 to 1E10 ns, TIE: 0.0 to ±1E10 ns
Accuracy: Conform to ITU-T O.172
Measurement time: 10 to 1 x 10
8
s (Max. 120,000 s: MP1570A only)
Wander application (requires MX150001B Wander Application Software)
Wander measurement
TIE: Max. 1 x 10
8
s
MTIE: Max. 1 x 10
8
s
TDEV: Max. 1 x 10
6
s
Frequency offset: Measurement with conform to ANSI TI.105.09
Frequency drift rate: Measurement with conform to ANSI TI.105.09
MRTIE: Evaluation separated from the wander by the frequency variation
Wander tolerance (TDEV) measurement: Evaluation by the various TDEV mask generations
Wander transfer (TDEV) measurement: Calibration method by simulation, outputting results by the one measurement
Frequency error Frequency range
±8% 10 µHz to 0.1 Hz
±12% 0.1 to 0.2 Hz
F5F4F3F2F1F0
A2
A1
A0
[UIp-p]
Wander modulation
Modulation frequency (Hz)
Bit rate
Amplitude (UIp-p) Frequency (Hz)
(Mbit/s)
A0 A1 A2 f0 f1 f2 f3 f4 f5
2488.32 57600 6480 810 10µ 180µ 1.6m 16m 0.13 0.2
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